Nouveau produit pour la chimie supramoléculaire

POLLEN Metrology introducing our new software product dedicated to Direct Self Assemble (DSA) features measurements for electronic materials. POLLEN Metrology will be at the first DSA symposium organized at IMEC from October 25 until 27. Visit our poster made with our co-authors from IMEC institute. Our product is compatible with AFM & SEM images. Output features are: CD, roughness, period, defect numbers and classification, circularity, full statistics per image and individual statistics for each nanostructure…Reduce your learning cycle time and maximize your returns

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